Storage device testing system cooling

ABSTRACT

A storage device transporter includes a transporter body having first and second body portions. The first body portion is configured to be engaged by automated machinery for manipulation of the storage device transporter. The second body portion is configured to receive and support a storage device. The first body portion is configured to receive and direct an air flow over one or more surfaces of a storage device supported in the second body portion.

CROSS REFERENCE TO RELATED APPLICATIONS

This U.S. patent application is a continuation-in-part of, and claimspriority under 35 U.S.C. §120 from, U.S. patent application Ser. No.12/698,575, filed on Feb. 2, 2010. This application is acontinuation-in-part of, and claims priority under 35 U.S.C. §120 from,U.S. application Ser. No. 12/503,567, filed Jul. 15, 2009 now U.S. Pat.No. 7,920,380, now pending. The disclosures of both of these priorapplications is considered part of the disclosure of this applicationand are incorporated herein by reference in their entirety.

TECHNICAL FIELD

This disclosure relates to cooling in storage device testing systems.

BACKGROUND

Storage device manufacturers typically test manufactured storage devicesfor compliance with a collection of requirements. Test equipment andtechniques exist for testing large numbers of storage devices seriallyor in parallel. Manufacturers tend to test large numbers of storagedevices simultaneously. Storage device testing systems typically includeone or more racks having multiple test slots that receive storagedevices for testing.

During the manufacture of disk drives or other storage devices, it iscommon to control the temperature of the storage devices, e.g., toensure that the storage devices are functional over a predeterminedtemperature range. For this reason, the testing environment immediatelyaround the storage devices can be varied under program control. In someknown testing systems, sometimes called “batch testers,” the temperatureof plural storage devices is adjusted by using cooling or heating airwhich is common to all of the storage devices.

Batch testers generally require all storage device tests to be atsubstantially the same temperature, and require all storage devices tobe inserted or removed from the test system at substantially the sametime. Storage devices generally vary substantially in both the timerequired to test them and the amount of time that each test requires aparticular ambient temperature. Because of these variations, batchtesters tend to inefficiently use available testing capacity. There arealso known testing systems that allow separate control of the insertion,removal, and temperature of each storage device. These test systems tendto more efficiently use the available testing capacity, but requireduplication of temperature control components across every test slot, orsharing of those components among a small number of test slots.

Some storage device test systems use heated or cooled air to heat orcool the storage device. For separate thermal control of each storagedevice, a separate closed-loop air flow is sometimes used, with heatersor coolers disposed in the air flow. In some examples, the storagedevice is allowed to self-heat, and thus only a cooler is used. Heatingmay also be enhanced by reducing or otherwise controlling the flow ofthe air, and cooling may also be enhanced by increasing the air flow. Insome examples of separate thermal control of each storage device, air isdrawn from ambient air outside of the tester, rather than through acooler that draws heat from a closed loop air flow.

Disadvantages of systems with separate thermal controls for each testslot include the need for many separate thermal control components foreach test slot (e.g., heaters, coolers, fans, and/or controllablebaffles). In addition, efficient use of energy generally requires eachtest slot to have a closed loop air flow system during at least some ofthe operating time. A closed loop air flow system typically requiresducting for the air to flow in both directions, to complete a loop,which requires additional space for the air return path. In addition,coolers may create condensation when operating below the dew point ofthe air. The formation of condensation may be avoided at the cost ofreduced cooling performance, by limiting the coolant temperature.Alternatively, the formation of condensation may be avoided controllingand/or removing the moisture content in the air.

SUMMARY

The present disclosure provides a storage device testing system thatreduces the number of temperature control components generally required,while still allowing separate control of the temperature of each testslot, thus achieving greater test slot density and lower cost. Thestorage device testing system provides separate thermal control for eachstorage device test slot, with relatively fewer thermal controlcomponents, and without a separate closed loop air flow path for eachtest slot. The thermal control for a storage device testing systemresults in substantially no condensation forming in or near the testslot, without having to manage the moisture content of the air. Thestorage device testing system uses a common reservoir of cooled air,which is cooled by relatively few heat exchangers. Condensation formedon the heat exchangers is concentrated in relatively few locations andmay be removed by conventional methods, such as evaporators or drains.Alternatively, the heat exchangers may be controlled to operate abovethe dew point. Air from the common reservoir is drawn though each testslot using a separate controllable air mover for each test slot. Theamount of cooling may be controlled by the speed of the air mover. Toheat a storage device received in a test slot, a heater may be placed inan inlet air path to the test slot, a direct contact heater may beplaced on the received storage device, or the storage device may beallowed to self heat by reducing or shutting off the air flow throughthe test slot. In some implementations, the reservoir of cooled air isformed by the shape of the storage device testing system, rather than bya separate enclosure. The cooling air may also be used to cool otherelectronics disposed with in the storage device testing system.

One aspect of the disclosure provides a storage device transporter thatincludes a transporter body having first and second body portions. Thefirst body portion is configured to be engaged by automated machineryfor manipulation of the storage device transporter. The second bodyportion is configured to receive and support a storage device. The firstbody portion is configured to receive and direct an air flow over one ormore surfaces of a storage device supported in the second body portion.

Implementations of the disclosure may include one or more of thefollowing features.

In some implementations, the first body portion includes an air directorhaving one or more air entrances for receiving air into the first bodyportion and directing air into the second body portion. The one or moreair entrances can be configured to be engaged by automated machinery formanipulation of the storage device transporter.

In some examples, the second body portion includes first and secondsidewalls arranged to receive a storage device therebetween.

In some cases, the first body portion can include one or more visionfiducials.

The storage device transporter can include a clamping mechanism that isoperable to clamp a storage device within the second body portion.

In some implementations, the first body portion is configured to directair over top and bottom surfaces of a storage device supported in thesecond body portion.

In certain implementations, the first body portion can include an airdirector having one or more air entrances for receiving air into thefirst body portion and directing air into the second body portion. Theone or more air entrances can be arranged to register the storage devicetransporter in X, Y, and rotational directions when the storage devicetransporter is engaged by automated machinery.

In some examples, the second body portion defines a substantiallyU-shaped opening which allows air to flow over a bottom surface of astorage device supported in the storage device transporter.

Another aspect of the disclosure provides a test slot assembly thatincludes a storage device transporter and a test slot. The storagedevice transporter includes a transporter body having first and secondbody portions. The first body portion is configured to be engaged byautomated machinery for manipulation of the storage device transporter,and the second body portion is configured to receive and support astorage device. The first body portion is configured to receive anddirect an air flow over one or more surfaces of a storage devicesupported in the second body portion. The test slot includes a housing.The housing defines a test compartment for receiving and supporting thestorage device transporter, and an open end that provides access to thetest compartment for insertion and removal of the disk drivetransporter.

Implementations of the disclosure may include one or more of thefollowing features. In some implementations, the storage devicetransporter is completely removable from the test compartment.

In certain implementations, the storage device transporter is connectedto the test slot in such a manner as to form a drawer for receiving astorage device.

Another aspect of the disclosure provides a storage device testingsystem that includes automated machinery and a storage devicetransporter. The storage device transporter includes a transporter bodyhaving first and second body portions. The first body portion isconfigured to be engaged by automated machinery for manipulation of thestorage device transporter. The second body portion is configured toreceive and support a storage device. The first body portion isconfigured to receive and direct an air flow over one or more surfacesof a storage device supported in the second body portion.

Implementations of the disclosure may include one or more of thefollowing features.

In some implementations, the first body portion includes an air directorhaving one or more air entrances for receiving air into the first bodyportion and directing air into the second body portion, and the one ormore air entrances are configured to be engaged by the automatedmachinery for manipulation of the storage device transporter.

In certain implementations, the automated machinery includes amechanical actuator adapted to engage the one or more air entrances.

In some implementations, the first body portion includes one or morevision fiducials, and the automated machinery includes an optical systemfor detecting the vision fiducials.

In certain implementations, the automated machinery includes posts andthe first body portion includes one or more air entrances for receivingair into the first body portion and directing air into the second bodyportion. The air entrances are arranged to be engaged by the posts toregister the storage device transporter in X, Y, and rotationaldirections when the storage device transporter is engaged by theautomated machinery.

In some implementations, the first body portion includes a pair ofslots, and the automated machinery includes a pair of claws operable toengage the slots.

In certain implementations, the storage device testing system includes aclamping mechanism that is operable to clamp a storage device within thesecond body portion. The automated machinery is operable to actuate theclamping mechanism.

In some implementations, the automated machinery includes a robotic armand a manipulator attached to the robotic arm. The manipulator isconfigured to engage the storage device transporter.

The details of one or more implementations of the disclosure are setforth in the accompanying drawings and the description below. Otherfeatures, objects, and advantages will be apparent from the descriptionand drawings, and from the claims.

DESCRIPTION OF DRAWINGS

FIG. 1 is a perspective view of a storage device testing system havingracks arranged in a substantially circular configuration.

FIG. 2 is a top view of the storage device testing system shown in FIG.1.

FIG. 3 is a perspective view of a storage device testing system and atransfer station.

FIG. 4 is a perspective view of a manipulator.

FIG. 5A is a side perspective view of a storage device transporter.

FIG. 5B is a front perspective views of the storage device transportershown in FIG. 4A.

FIG. 5C is a bottom perspective views of a storage device transportercarrying a storage device.

FIG. 5D is a side perspective view of a storage device transporterreceiving a storage device.

FIG. 5E is perspective view of a front panel of the storage devicetransporter.

FIGS. 6A and 6B are perspective views of a rack receiving a test slotcarrier holding test slots.

FIG. 7A is a perspective views of a test slot carrier holding testslots, one of which is receiving a storage device transporter carrying astorage device.

FIG. 7B is a rear perspective views of the test slot carrier of FIG. 7A.

FIG. 7C is a sectional view of a test slot carrier along line 6C-6C inFIG. 6A.

FIGS. 8A and 8B are perspective views of a test slot receiving a storagedevice transporter carrying a storage device.

FIG. 8C is a rear perspective view of a test slot.

FIG. 9 is a perspective view of an air mover.

FIGS. 10A and 10B are perspective views of a rack of a storage devicetesting system showing an air flow path through the rack and test slotshoused by the rack.

FIG. 11A is an exploded perspective view of a test slot assemblyincluding a storage device transporter.

FIG. 11B is a perspective view of the test slot assembly of FIG. 11Aincluding a storage device transporter in the form of a drawer assembledwith a test slot.

FIGS. 12A and 12B are perspective views of a storage device transportercarrying a storage device being received inserted into a test slot of astorage device testing system.

FIG. 13 is a sectional view of a test slot along line 13-13 in FIG. 12A.

FIG. 14 is a side perspective view of a storage device transporter.

FIG. 15 is a front perspective view of a storage device transporter.

FIG. 16 is a bottom perspective view of a storage device transporter.

FIG. 17 is a perspective view of a storage device transporter receivinga storage device.

FIG. 18 is a perspective view of a test slot and a test slot coolingsystem in a rack of a storage device testing system.

FIG. 19 is a perspective view of an air cooler.

FIG. 20 is a perspective view of an air mover.

FIG. 21 is a top view of a test slot and a test slot cooling system in arack of a storage device testing system showing an air flow path throughthe test slot and a test slot cooling system.

FIG. 22 is a side sectional view of a test slot showing an air flow pathover the top and bottom surfaces of a storage device received in thetest slot.

Like reference symbols in the various drawings indicate like elements.

DETAILED DESCRIPTION

Temperature regulation of a storage device can be an important factorduring testing (e.g., validation, qualification, functional testing,etc.) of a storage device. One method of performing temperatureregulation includes moving air over and/or about the storage deviceduring testing. As will be discussed in detail, the volume, temperature,and flow path of the air moved with respect to the storage device duringtesting, inter alia, can each be factors in providing reliable,effective, and efficient temperature control of the storage device.

A storage device, as used herein, includes disk drives, solid statedrives, memory devices, and any device that benefits from asynchronoustesting for validation. A disk drive is generally a non-volatile storagedevice which stores digitally encoded data on rapidly rotating platterswith magnetic surfaces. A solid-state drive (SSD) is a data storagedevice that uses solid-state memory to store persistent data. An SSDusing SRAM or DRAM (instead of flash memory) is often called aRAM-drive. The term solid-state generally distinguishes solid-stateelectronics from electromechanical devices.

Referring to FIGS. 1-3, in some implementations, a storage devicetesting system 100 includes at least one automated transporter 200 (e.g.robot, robotic arm, gantry system, or multi-axis linear actuator)defining a first axis 205 (see FIG. 3) substantially normal to a floorsurface 10. In the examples shown, the automated transporter 200comprises a robotic arm 200 operable to rotate through a predeterminedarc about the first axis 205 and to extend radially from the first axis205. The robotic arm 200 is operable to rotate approximately 360° aboutthe first axis 205 and includes a manipulator 210 disposed at a distalend 202 of the robotic arm 200 to handle one or more storage devices 500and/or storage device transporters 800 to carry the storage devices 500(see e.g., FIGS. 5A-5E). Multiple racks 300 are arranged around therobotic arm 200 for servicing by the robotic arm 200. Each rack 300houses multiple test slots 330 configured to receive storage devices 500for testing. The robotic arm 200 defines a substantially cylindricalworking envelope volume 220, with the racks 300 being arranged withinthe working envelope 220 for accessibility of each test slot 330 forservicing by the robotic arm 200. The substantially cylindrical workingenvelope volume 220 provides a compact footprint and is generally onlylimited in capacity by height constraints. In some examples, the roboticarm 200 is elevated by and supported on a pedestal or lift 250 on thefloor surface 10. The pedestal or lift 250 increases the size of theworking envelope volume 220 by allowing the robotic arm 200 to reach notonly upwardly, but also downwardly to service test slots 330. The sizeof the working envelope volume 220 can be further increased by adding avertical actuator to the pedestal or lift 250. A controller 400 (e.g.,computing device) communicates with each automated transporter 200 andrack 300. The controller 400 coordinates servicing of the test slots 330by the automated transporter(s) 200.

The robotic arm 200 is configured to independently service each testslot 330 to provide a continuous flow of storage devices 500 through thetesting system 100. A continuous flow of individual storage devices 500through the testing system 100 allows varying start and stop times foreach storage device 500, whereas other systems that require batches ofstorage devices 500 to be run all at once as an entire testing load mustall have the same start and end times. Therefore, with continuous flow,storage devices 500 of different capacities can be run at the same timeand serviced (loaded/unloaded) as needed.

Referring to FIGS. 1-3, the storage device testing system 100 includes atransfer station 600 configured for bulk feeding of storage devices 500to the robotic arm 200. The robotic arm 200 independently services eachtest slot 330 by transferring a storage device 500 between the transferstation 600 and the test slot 330. The transfer station 600 houses oneor more totes 700 carrying multiple storage devices 500 presented forservicing by the robotic arm 200. The transfer station 600 is a servicepoint for delivering and retrieving storage devices 500 to and from thestorage device testing system 100. The totes 700 allow an operator todeliver and retrieve a collection of storage devices 500 to and from thetransfer station 600. In the example shown in FIG. 3, each tote 700 isaccessible from respective tote presentation support systems 720 in apresentation position and may be designated as a source tote 700 forsupplying a collection of storage devices 500 for testing or as adestination tote 700 for receiving tested storage devices 500 (or both).Destination totes 700 may be classified as “passed return totes” or“failed return totes” for receiving respective storage devices 500 thathave either passed or failed a functionality test, respectively.

In implementations that employ storage device transporters 800 (FIGS.5A-5E) for manipulating storage devices 500, the robotic arm 200 isconfigured to remove a storage device transporter 800 from one of thetest slots 330 with the manipulator 210, then pick up a storage device500 from one the totes 700 presented at the transfer station 600 orother presentation system (e.g., conveyor, loading/unloading station,etc.) with the storage device transporter 800, and then return thestorage device transporter 800, with a storage device 500 therein, tothe test slot 330 for testing of the storage device 500. After testing,the robotic arm 200 retrieves the tested storage device 500 from thetest slot 330, by removing the storage device transporter 800 carryingthe tested storage device 500 from the test slot 330 (i.e., with themanipulator 210), carrying the tested storage device 500 in the storagedevice transporter 800 to the transfer station 600, and manipulating thestorage device transporter 800 to return the tested storage device 500to one of the totes 700 at the transfer station 600 or other system(e.g., conveyor, loading/unloading station, etc.).

Referring to FIG. 4, the manipulator 210 may include an optical system212 and a mechanical actuator 240. The optical system 212 may include acamera 220 and a light source 230. A storage device 500 may be carriedby the storage device transporter 800 (FIGS. 5A-5E) that is gripped bythe manipulator 210 via the mechanical actuator 240.

As illustrated in FIGS. 5A-5E, the storage device transporter 800includes a transporter body 810 having first and second portions 802,804. The first portion 802 of the transporter body 810 includes amanipulation feature 812 (e.g., indention, protrusion, aperture, etc.)configured to receive or otherwise be engaged by the manipulator 210 fortransporting. The second portion 804 of the transporter body 810 isconfigured to receive a storage device 500. In some examples, the secondtransporter body portion 804 defines a substantially U-shaped opening820 formed by first and second sidewalls 822, 824 and a base plate 826of the transporter body 810. The storage device 500 is received in theU-shaped opening 820. FIGS. 5C-5D illustrate an exemplary storage device500 that includes a housing 510 having top, bottom, front, rear, leftand right surfaces 512, 514, 516, 518, 520, 522. The U-shaped opening820 allows air moving through the test sot 330 to flow over the bottomsurface 514 of the storage device 500. The storage device 500 istypically received with its rear surface 518 substantially facing thefirst portion 802 of the storage device transporter body 810. The firstportion 802 of the transporter body 810 includes an air director 830(front panel) that receives and directs air substantially simultaneously(e.g., in parallel) over at least the top and bottom surfaces 512, 514of the storage device 500 received in the storage device transporter800. The air director 830 defines one or more air entrances 832 a-c(e.g., aperture(s), slot(s), etc.) for receiving air into the firstportion 802 of the transporter body 810 and directing it out into thesecond portion 804 of the transporter body 800, such that the air canmove over at least the top and bottom surfaces 512, 514 of the receivedstorage device 500. In some implementations, the air director 830includes a guide (e.g., diverter, fin, plenum, etc.) for guiding the airover the received storage device 500.

Referring to FIG. 5A, there is seemingly no area left to include anadditional mechanical protrusion or cavity for a gripper 242 (FIG. 4) ofthe mechanical actuator 240 to engage. But, by designing the gripper242, such as illustrated in FIG. 4, such that it exploits cavities,rather than protrusions, it is possible to combine the functionality ofthe air entrances with the gripper 242 of the mechanical actuator 240.In this example, (shown in close up in FIG. 5E), the gripper 242 canengage with the center rectangular cutout 832 a and with the two roundholes 832 b, allowing the air entrances to serve also as engagementfeatures.

The round holes 832 a allow posts 244 on the gripper 242 to register thestorage device transporter 800 in the X and Y dimensions, as well asrotationally since multiple holes are used for registration. Therectangular cutout 832 a contains internal slots 834 for claws 246 a,246 b of the gripper 242 to engage and pull the storage devicetransporter 800 to a registration point on the face of the gripper 242in the Z dimension.

As illustrated in FIGS. 5A and 5C, sufficient area remains formechanical rigidity and to place two fiducial marks 836 for the opticalsystem 212 (FIG. 3) to detect. Alternatively or additionally, the airentrances 832 a-c themselves may be used as vision fiducials.

In some examples, the storage device transporter 800 includes a heater860 that either provides conductive heating by direct contact with areceived storage device 500 or convective heating by heating air flowinginto and/or over the storage device transporter 800 and the receivedstorage device 500. A detailed description of the heater 860 and otherdetails and features combinable with those described herein may be foundin the following U.S. patent application Ser. No. 12/503,593, filed onJul. 15, 2009, the entire contents of which are hereby incorporated byreference.

Some storage devices 500 can be sensitive to vibrations. Fittingmultiple storage devices 500 in a single test rack 330 and running thestorage devices 500 (e.g., during testing), as well as the insertion andremoval of the storage device transporters 800, each optionally carryinga storage device 500, from the various test slots 330 in the test rack300 can be sources of undesirable vibration. In some cases, for example,one of the storage devices 500 may be operating under test within one ofthe test slots 330, while others are being removed and inserted intoadjacent test slots 330 in the same rack 300. Clamping the storagedevice transporter 800 to the test slot 330 after the storage devicetransporter 800 is fully inserted into the test slot 330 can help toreduce or limit vibrations by limiting the contact and scraping betweenthe storage device transporters 800 and the test slots 330 duringinsertion and removal of the storage device transporters 800.

In some implementations, the manipulator 210 is configured to initiateactuation of a clamping mechanism 840 disposed in the storage devicetransporter 800. This allows actuation of the clamping mechanism 840before the storage device transporter 800 is moved to and from the testslot 330 to inhibit movement of the storage device 500 relative to thestorage device transporter 800 during the move. Prior to insertion inthe test slot 330, the manipulator 210 can again actuate the clampingmechanism 840 to release the storage device 500 within the transporterbody 800. This allows for insertion of the storage device transporter800 into one of the test slots 330, until the storage device 500 is in atest position engaged with the test slot 330 (e.g., a storage deviceconnector 532 (e.g., electrical connector) of the storage device 500(FIG. 7C) is engaged with a test slot connector 392 (FIG. 7C) (e.g.,electrical connector) of the test slot 330). The clamping mechanism 840may also be configured to engage the test slot 330, once receivedtherein, to inhibit movement of the storage device transporter 800relative to the test slot 330. In such implementations, once the storagedevice 500 is in the test position, the clamping mechanism 840 isengaged again (e.g., by the manipulator 210) to inhibit movement of thestorage device transporter 800 relative to the test slot 330. Theclamping of the storage device transporter 800 in this manner can helpto reduce vibrations during testing. In some examples, after insertion,the storage device transporter 800 and storage device 500 carriedtherein are both clamped or secured in combination or individuallywithin the test slot 330. A detailed description of the storage devicetransporter 800 and other details and features combinable with thosedescribed herein may be found in U.S. patent application Ser. No.12/503,687, filed on Jul. 15, 2009, and in U.S. patent application Ser.No. 12/503,567, filed on Jul. 15, 2009. These applications are herebyincorporated by reference in their entireties.

In the examples illustrated in FIGS. 6A and 6B, each rack 300 includesone or more carrier receptacles 310 each configured to receive a testslot carrier 320 that carries one or more test slots 330. The test slotcarrier 320 provides a collection of test slots 330 that allows for bulkloading of test slots 330 into a rack 300. The rack 300 can be quicklyserviced to change out different types of test slots 330 by removing onetest slot carrier 320 having one type of test slots 330 from itsrespective carrier receptacle 310 and loading another carrier 320 havinga different type or assortment of test slots 330 without having tomodify the rack 300 to accommodate a particular mounting spacing foreach type of test slot 330. Some carrier receptacles 310 may have acommon standard size for receiving complementary standard sized testslot carriers 320. The number of test slot receptacles 324 anyparticular test slot carrier 320 carries may vary depending upon thetype(s) of test slots 330 received therein. For example, a test slotcarrier 320 will accommodate fewer relatively larger test slots 330 fourreceiving relatively larger storage devices 500 as compared torelatively smaller (thinner) test slots 300 for relatively smallerstorage devices 500.

Each rack 300 includes an air conduit 304 (also shown in FIGS. 10A and10B) that provides pneumatic communication between each test slot 330 ofthe respective rack 300 and an exit 353 of the rack 300. In someimplementations, the air conduit 304 is formed by a space between thetest slots 330 and a rear wall 303 of the rack 300. The air conduit 304can also be attached to an exterior of the rack 300, such as the wedgeshaped conduit 304 shown in FIG. 6B. In some implementations, as shownin FIG. 3, the air conduit 304 is in pneumatic communication with asystem air mover 190 (e.g., via a common system air conduit 345) and/orair exterior to the rack 300, for moving air between the rack 300 andthe environment around the rack 300. In this case, the system air mover190 can be pneumatically connected to every air conduit 304 in thestorage device testing system 100 (e.g., via the common system airconduit 345, which may include a bottom portion of the racks 300 belowthe test slots 330) to move air through each of the air conduits. Thesystem air mover 190 moves air exterior of the racks 300 through thetest slots 330 into the air conduits 304 and back out of the racks 300.

In the example shown in FIG. 6B, the air conduit 304 (also shown inFIGS. 10A and 10B) provides pneumatic communication between each testslot 330 of the respective rack 300 and an air heat exchanger 350. Theair heat exchanger 350 is disposed below the carrier receptacles 310remote to received test slots 330. The air heat exchanger 350 includesan air heat exchanger housing 352 defining an entrance 351, an exit 353,and an air flow path 305 therebetween. In some implementations, coolingelements 354 are disposed in the housing 352 in the air flow path 305and a pump 356 delivers condensation accumulated from the air heatexchanger 350 to an evaporator 360, which may be disposed on therespective rack 300 of the air heat exchanger 350 (e.g., above thecarrier receptacles 310), or to a drain. The air heat exchanger 350 mayinclude an air mover 358 that pulls the air from the air conduit 304into the entrance 351 of the air heat exchanger housing 352 over thecooling elements 354, if implemented, and moves the air out of the airheat exchanger housing exit 353 and out of the rack 300.

Referring to FIGS. 7A-7C, each test slot carrier 320 includes a body 322having test slot receptacles 324 that are each configured to receive atest slot 330. Each test slot 330 is configured to receive a storagedevice transporter 800, which is configured to receive the storagedevice 500 and be handled by the manipulator 210 of the robotic arm 200.In use, one of the storage device transporters 800 is removed from ordelivered to one of the test slots 330 by the robotic arm 200. Each testslot receptacle 324 may include one or more isolators 326 (e.g., rubbergrommet) to dampen or isolate vibrations between the carrier body 322and a received storage device 500. A detailed description of the testslot carrier 320 and other details and features combinable with thosedescribed herein may be found in the following U.S. patent applicationsfiled Feb. 2, 2010, entitled “Test Slot Carriers”, inventors: BrianMerrow et al., and having assigned Ser. No. 12/698,605, the entirecontents of which are hereby incorporated by reference.

Referring to FIGS. 7C and 8A-8C, each test slot 330 includes a test slothousing 340 for receipt by the rack 300 or a test slot receptacle 324 ofa test slot carrier 320. The test slot housing 340 has first and secondportions 342, 344. The first portion 342 of the test slot housing 340defines a device opening 346 sized to receive a storage device 500and/or a storage device transporter 800 carrying the storage device 500.The second portion 344 of the test slot housing 340 includes an air exit348, electronics 390 (e.g., circuit board(s)), and an optional air mover900. The electronics 390 are in communication with a test slot connector392, which is configured to receive and establish electricalcommunication with a storage device connector 532 of the storage device500. The electronics 390 also include a slot-rack connector 394 forestablishing electrical communication with the rack 300. Air movedthrough the test slot 300 can be directed over the electronics 390.

FIG. 9 illustrates an exemplary air mover 900 which has an air entrance902 that receives air along a first direction 904 and an air exit 906that delivers air along a second direction 908 substantiallyperpendicular to the first direction. Changing the direction of airmovement within the air mover 900 eliminates the efficiency loss ofchanging the air flow direction within a conduit, thereby increasing thecooling efficiency of the storage device testing system 100. In someimplementations, the air mover 900 includes an impeller 910 rotating atabout 7100 revolutions per minute (rpm) to produce an air flow rate ofup to about 0.122 m³/min (4.308 CFM) (at zero static pressure) and anair pressure of up to about 20.88 mmH₂O (0.822 inch H₂O) (at zero airflow). In some instances, the air mover 900 is the largest component ofa cooling system for a test slot 330. The substantially horizontalplacement of the air mover 900 within the storage device testing system100 allows for a relatively lower overall height of the test slot 330(allowing greater test slot density in the rack 300 and/or test slotcarrier 320).

FIGS. 7C and 10A-10B illustrate a flow path 305 of air through testslots 330 and a rack 300 for regulating the temperature of a storagedevice 500 received in the storage device testing system 100. The airmover 900 of each test slot 330 housed in the rack 300 moves a flow ofair from an exterior space of the rack 300 into at least one entrance832 of the air director 830 of a storage device transporter 800 receivedin the test slot 330. The air flow is directed substantiallysimultaneously over at least top and bottom surfaces 512, 514 of thestorage device 500 received in the storage device transporter 800. FIG.7C provides a side sectional view of the test slot 330 and the air flowpath 305 over the top and bottom surfaces 512, 514 of the receivedstorage device 500. The air may also flow over other surfaces of thestorage device 500 (e.g., front, back, left and right sides 516, 518,520, 522). If no storage device 500 or storage device transporter 800 isreceived in the test slot 330, the air can flow directly through thefirst portion 342 of the test housing 340 to the air mover 900. The airmover 900 moves the air through the second portion 344 of the test slothousing 340 and out an air exit 348 (FIG. 7B) of the test slot 330 intothe air conduit 304. The air moves through the air conduit 304 to theair heat exchanger 350 or the environment exterior to the rack 300.After passing through the air heat exchanger 350 the air is releasedback into the exterior space of the rack 300.

In some examples, the air mover 900 pulls the air into the air director830 of storage device transporter 800, which directs the air flow 305over at least the top and bottom surfaces 512, 514 of the storage device500. The air mover 900 receives the flow of air from over the receivedstorage device 500 along a first direction and delivers the air flowfrom the air mover 900 to the exit 348 of the test slot 330 along asecond direction substantially perpendicular to the first direction.

In the examples shown, the storage device transporter 800 providesclosure of the device opening 346 of the test slot housing 340 oncereceived therein. As the air mover 900 moves the air to circulate alongthe air path 305, the air moves from the first portion 342 of the testslot housing 340 along a common direction to the second portion 344 ofthe test slot housing 340 while traversing the entire length of thereceived storage device 500. Since the air moves substantiallyconcurrently along at least the top and bottom surfaces 512, 514 of thestorage device 500, the air provides substantially even cooling of thestorage device 500. If the air was routed along one side of the storagedevice first, such as the top surface 512, and then directed alonganother side sequentially second, such as the bottom surface 514, theair would become preheated after passing over the first side of thestorage device 500 before passing over any additional sides of thestorage device, thereby providing relatively less efficient cooling thanflowing air over two or more sides of the storage device 500substantially concurrently and/or without recirculation over the storagedevice 500 before passing through the air heat exchanger 350.

A method of performing storage device testing includes presenting one ormore storage devices 500 to a storage device testing system 100 fortesting at a source location (e.g., a loading/unloading station 600,storage device tote 700, test slot(s) 330, etc.) and actuating anautomated transporter 200 (e.g. robotic arm) to retrieve one or morestorage devices 500 from the source location and deliver the retrievedstorage device(s) 500 to corresponding test slots 330 disposed on a rack300 of the storage device testing system 100. The method includesactuating the automated transporter 200 to insert each retrieved storagedevice 500 in its respective test slot 330, and performing a test (e.g.,functionality, power, connectivity, etc.) on the storage devices 500received by the test slot 330. The method may also include actuating theautomated transporter 200 to retrieve the tested storage device(s) 500from the test slot(s) 330 and deliver the tested storage device(s) 500to a destination location (e.g., another test slot 330, a storage devicetote 700, a loading/unloading station 600, etc).

A method of regulating the temperature of a storage device 500 receivedin a storage device testing system 100 includes moving a flow of airinto an air entrance 346 of a test slot housing 340 of a test slot 330of a rack 300, moving the air flow over a storage device 500 received inthe test slot 330, moving the air out an air exit 348 of the test slothousing 340 of the test slot 330, and releasing the air exteriorly ofthe rack 300. This method may be executed on a storage device testingsystem 100 to reduce the relative number of temperature controlcomponents generally required, while still allowing separate control ofthe temperature of each test slot 330. The method allows the storagedevice testing system 100 to have separate thermal control for eachstorage device test slot 330, with relatively fewer thermal controlcomponents, and without a separate closed loop air flow path for eachtest slot 330. In some examples, the method results in substantially nocondensation forming in or near the test slot(s) 330, without having tomanage the moisture content of the air.

In some implementations, the method includes using a common reservoir ofcooled air, which may cooled by one or more air heat exchangers 350.Condensation formed on the air heat exchanger(s) 350 is concentrated inrelatively few locations and may be removed by conventional methods,such as evaporators or drains. Alternatively, the heat exchanger(s) 350may be controlled to operate above the dew point. Air from the commonreservoir is drawn though each test slot 330 using a separatecontrollable air mover 900 for each test slot 330. The amount of coolingmay be controlled by the speed of the air mover 900. To heat a storagedevice 500 received in a test slot 330, a heater 860 may be disposed soas to heat the received storage device 500 either directly orindirectly. For example, the heater 860 maybe placed in the inlet airpath 346 to the test slot 330 and/or in direct contact with the receivedstorage device. In some examples, the method includes allowing thereceived storage device 500 to self heat by reducing or shutting off theair flow through the test slot 300. In some implementations, thereservoir of cooled air is formed by the shape of the storage devicetesting system 100, rather than by a separate enclosure. The cooling airmay also be used to cool other electronics disposed with in the storagedevice testing system 100.

In some examples, the air is moved to flow substantially simultaneouslyover at least the top and bottom surfaces 512, 514 of the storage device500 received in the test slot 330. In some implementations, the methodincludes pulling air exterior of the rack 300 into a first portion 342of the test slot housing 340 with an air mover 900 disposed in the testslot housing 340 and then moving the air through a second portion 344 ofthe test slot housing 340 over electronics 350 disposed in the secondportion 344 and out an air exit 348 of the test slot housing 340. Themethod may include receiving the flow of air into the air mover 900along a first direction 904 and moving the flow to the air exit 906 ofthe air mover 900 along a second direction 908 substantiallyperpendicular to the first direction 904. In some examples, the methodincludes delivering the air flow out of the air mover 900 at an air flowrate of up to about 0.122 m3/min (4.308 CFM) and an air pressure of upto about 20.88 mmH2O (0.822 inchH2O).

The method may include moving the air flow through an air director 830of a storage device transporter 800 holding the storage device 500 andreceived in the test slot 330. The air director 830 defines one or moreair entrances 832 that receive and direct the flow of air over at leastthe top and bottom surfaces 512, 514 of the storage device 500. Thestorage device transporter 800 includes a body 800 having first andsecond portions 802, 804. In some examples, the method includesreceiving the storage device 500, which has top, bottom, front, rear,right, and left side surfaces 512, 514, 516, 518, 520, 522, in thestorage device transporter 800 such that the rear surface 518substantially faces the first body portion 802 of the storage devicetransporter body 800.

In some implementations, the method includes moving the flow of air fromthe test slot 330 to an air heat exchanger 350 through an air conduit304 that provides pneumatic communication therebetween. The air heatexchanger 350, in some examples, includes an air mover 358 that pullsthe air from the air conduit 304 into the entrance 351 of the air heatexchanger housing 352 over the cooling elements 354 and moves the airout of the air heat exchanger housing exit 353 and out of the rack 300.The method may also include pumping condensation of the air heatexchanger 350 to an evaporator 360 disposed on the rack 300 or pumpingto a drain, or allowing the condensate to drain through gravity.

OTHER IMPLEMENTATIONS

A number of implementations have been described. Nevertheless, it willbe understood that various modifications may be made without departingfrom the spirit and scope of the disclosure. For example, the air mayflow in the opposite direction from that given in the exemplaryembodiments. Air may also flow over only one side of the storage device,instead of over both the top and bottom surfaces. In systems with oneair mover per test slot, the test slot air mover may be disposed in anumber of locations, some not physically connected to the slot. Thermalcontrol of the test slot may include means of heating the air by theaddition of a heater in the inlet stream of the test slot. Whileimplementations described above included a storage device transporter inthe form of a removable carrier that is entirely removable from a testslot, in some implementations the storage device transporter is notentirely removable from the test slot, but instead remains connected tothe test slot in the form of a drawer. For example, FIGS. 11A and 11Billustrate an implementation of a test slot assembly in which thestorage device transporter 800′ includes projections 805 which slidewithin recessed slots 335 in the walls of the test slot 330′. Forwardmovement and complete removal of the storage device transporter 800′ isimpeded (e.g., prevented) by the end position of the recessed slots 335.Thus, in this example, the storage device transporter 800′ operates as adrawer that is slidable relative to the test slot 330′ allowinginsertion and removal of storage devices to and from the test slot 330′.

FIGS. 12A-22 illustrate another implementation of a test slot that maybe employed in storage device testing systems, such as described above.In the example illustrated in FIGS. 12A-13, each test slot 1330 isconfigured to receive the storage device transporter 1800. The storagedevice transporter 1800 is configured to receive the storage device 500and be handled by the manipulator 210 (FIG. 4) of the robotic arm 200(FIG. 1). In use, one of the storage device transporters 1800 is removedfrom or delivered to one of the test slots 1330 by the robotic arm 200.Each test slot 1330 includes a test slot housing 1340 received by therack 300 and having first and second portions 1342, 1344. The firstportion 1342 of the test slot housing 1340 defines a device opening 1346sized to receive a storage device 500 and/or a storage devicetransporter 1800 carrying the storage device 500 as well as a first airopening 1326 (i.e., air entrance). The second portion 1344 of the testslot housing 1340 defines a second air opening 1348 (i.e., air exit) andhouses electronics 1390.

As illustrated in FIGS. 14-17, the storage device transporter 1800includes a transporter body 1810 having first and second portions 1802,1804. The first portion 1802 of the transporter body 1810 includes amanipulation feature 1812 (e.g., indention, protrusion, etc.) configuredto receive or otherwise be engaged by the manipulator 210 fortransporting. The second portion 1804 of the transporter body 1810 isconfigured to receive a storage device 500. In some examples, the secondtransporter body portion 1804 defines a substantially U-shaped opening1820 formed by first and second sidewalls 1822, 1824 and a base plate1826 of the transporter body 1810. The storage device 1500 is receivedin the U-shaped opening 1820 and supported by at least the base plate1826. FIG. 17 illustrates an exemplary storage device 500 that includesa housing 510 having top, bottom, front, rear, left and right surfaces512, 514, 516, 518, 520, 522. The storage device 500 is typicallyreceived with its rear surface 518 substantially facing the firstportion 802 of the storage device transporter body 1800. The firstportion 1802 of the transporter body 1810 includes an air director 1830that receives and directs air substantially simultaneously (e.g., inparallel) over at least the top and bottom surfaces 512, 514 of thestorage device 500 received in the storage device transporter 1800. Theair director 1830 defines an air cavity 1831 having an air entrance 1832and first and second air exits 1834, 1835. The air director 1830 directsair received through its air entrance 1832 out of the first and secondair exits 1834, 1835. The first air exit 1834 directs air over the topsurface 512 of the received storage device 1800 and the second air exit1835 directs air over the bottom surface 514 of the received storagedevice 500.

In some implementations, the air director 1830 includes a plenum 1836disposed in the cavity 1831 for directing at least a portion of the airreceived through the air entrance 1832 out through the first air exit1834 and over at least the bottom surface 514 of the received storagedevice 500. In some implementations, the air director 1830 is weightedto stabilize the storage device transporter 1800 against vibration. Forexample, the plenum 1836 can be weighted or fabricated of a materialhaving a suitable weight. Air entering into the air cavity 1831 can alsoflow over a partition 1838 (above which is the second air exit 1835) toflow over at least the top surface 512 of the storage device 500. Withthe storage device 500 received within the transporter body 1810, thestorage device transporter 1810 and the storage device 500 together canbe moved by the automated transporter 200 (FIG. 1) for placement withinone of the test slots 310.

Some storage devices 500 can be sensitive to vibrations. Fittingmultiple storage devices 500 in a single test rack 300 and running thestorage devices 500 (e.g., during testing), as well as the insertion andremoval of the storage device transporters 550, each optionally carryinga storage device 500, from the various test slots 1330 in the test rack300 can be sources of undesirable vibration. In some cases, for example,one of the storage devices 500 may be operating under test within one ofthe test slots 1330, while others are being removed and inserted intoadjacent test slots 1330 in the same rack 300. Clamping the storagedevice transporter 1800 to the test slot 1330 after the storage devicetransporter 550 is fully inserted into the test slot 1330 can help toreduce or limit vibrations by limiting the contact and scraping betweenthe storage device transporters 1800 and the test slots 1330 duringinsertion and removal of the storage device transporters 1800.

In some implementations, the manipulator 210 (see, e.g., FIGS. 2 & 4) isconfigured to initiate actuation of a clamping mechanism 1840 disposedin the storage device transporter 1800. This allows actuation of theclamping mechanism 1840 before the storage device transporter 1800 ismoved to and from the test slot 1330 to inhibit movement of the storagedevice 500 relative to the storage device transporter 1800 during themove. Prior to insertion in the test slot 1330, the manipulator 210 canagain actuate the clamping mechanism 1840 to release the storage device500 within the transporter body 1810. This allows for insertion of thestorage device transporter 1800 into one of the test slots 1330, untilthe storage device 500 is in a test position engaged with the test slot1330 (e.g., a storage device connector 532 of the storage device 500(FIG. 17) is engaged with a test slot connector 1392 (FIG. 18) of thetest slot 1330). The clamping mechanism 1840 may also be configured toengage the test slot 1330, once received therein, to inhibit movement ofthe storage device transporter 1800 relative to the test slot 1330. Insuch implementations, once the storage device 500 is in the testposition, the clamping mechanism 1840 is engaged again (e.g., by themanipulator 210) to inhibit movement of the storage device transporter1800 relative to the test slot 1330. The clamping of the storage devicetransporter 1800 in this manner can help to reduce vibrations duringtesting. In some examples, after insertion, the storage devicetransporter 1800 and storage device 500 carried therein are both clampedor secured in combination or individually within the test slot 1330.

Referring again to FIGS. 12A-13 as well as FIG. 18, the rack 300includes a test slot cooling system 1900 disposed adjacent to each testslot 1330. The test slot cooling system 1900 includes a housing 1910having first and second air openings 1912, 1914 (i.e., air exit and airentrance). The housing 1910 receives air from the test slot 1330 throughthe second air opening 1914 and directs the air through an air cooler1920 to an air mover 1930 (e.g., blower, fan, etc.). In the exampleshown in FIG. 19, the air cooler 1920 includes an air cooler body 1922having one or more fins or plates 1924 disposed thereon. The air cooler1920 is coupled or attached to a cooling tube 1926 through which achilled liquid (e.g., water) flows. The chilled cooling tube 1926conducts heat from the air cooler 1920 which receives heat throughconvection from air flowing over the fins 1924. The air mover 1930 movesthe air through the first air opening 1912 back into the test slot 1330through its first air opening 1326. The first air opening 1326 of thetest slot housing 1340 is substantially aligned with the first airopening 1912 of the test slot cooling system housing 1900, and thesecond air opening 1348 of the test slot housing 1340 is substantiallyaligned with the second air opening 1914 of the test slot cooling systemhousing 1900. In examples using the storage device transporter 1800, thefirst air opening 1326 of the test slot housing 1340 is substantiallyaligned with the air entrance 1832 of the transporter body 1810 fordelivering temperature controlled air over a storage device 500 carriedby the storage device transporter 1800.

FIG. 20 illustrates an exemplary air mover 1930 which has an airentrance 1932 that receives air along a first direction 1934 and an airexit 1936 that delivers air along a second direction 1938 substantiallyperpendicular to the first direction. Changing the direction of airmovement within the air mover 1930 eliminates the efficiency loss ofchanging the air flow direction within a conduit, thereby increasing thecooling efficiency of the test slot cooling system 1900. In someimplementations, the air mover 1930 includes an impeller 1935 rotatingat about 7100 revolutions per minute (rpm) to produce an air flow rateof up to about 0.122 m³/min (4.308 CFM) (at zero static pressure) and anair pressure of up to about 20.88 mmH₂O (0.822 inchH₂O) (at zero airflow). In some instances, the air mover 1930 is largest component of thetest slot cooling system 1900 and therefore dictates the size of thetest slot cooling system 1900. In some implementations, the air mover1930 has length L of about 45 mm, a width W of about 45 mm, and a heightH of about 10 mm, such as DC Blower BFB04512HHA-8A60 provided by DeltaElectronics, Inc., Taoyuan Plant, 252 Shang Ying Road, Kuei SanIndustrial Zone, Yaoyuan Shien, Taiwan R.O.C. The substantiallyhorizontal placement of the air mover 1930 within the test slot coolingsystem 1900 allows for a relatively lower overall height of the testslot cooling system 1900, and therefore a relatively lower overallheight of an associated test slot 1330 (allowing greater test slotdensity in the rack 300). The ability of the air mover 1930 to redirectthe air flow path 1950 (FIG. 21) reduces air resistance in the air flowpath 1950, thereby lowering the power consumption of the air mover 1930to maintain a threshold air flow rate.

FIG. 21 provides a top view of the rack 300 and illustrates the air flowpath 1950 through the test slot cooling system 1900 and the test slot1330. FIG. 22 provides a side sectional view of the test slot 1330 andthe air flow path 1950 over the top and bottom surfaces 512, 514 of thereceived storage device 500. The air may also flow over other surfacesof the storage device 500 (e.g., front, back, left and right sides 516,518, 520, 522). The air mover 1930 delivers air through the first airopening 1912 (i.e., air entrance) of the test slot cooling systemhousing 1900 and the first air opening 1326 (i.e., air entrance) of thetest slot housing 1340 into the air director 1830 of the storage devicetransporter body 1810. The air flows through the air entrance 1832 ofthe air director 1830 in to the air cavity 1831. The air flows out ofthe first air exit 1834 of the air director 1830 (e.g., as directed bythe plenum 1836) and over at least the bottom surface 514 of the storagedevice 500. The air also flows through the second air exit 1835 (e.g.,over the partition 1838) and over at least the top surface 512 of thestorage device 500. The air moves from the first portion 1342 of thetest slot housing 1340 to the second portion 1344 of the test slothousing 1340. The air may move over the electronics 1390 in the secondportion 1344 of the test slot housing 1340. The air exits the test slothousing 1340 through its second air opening 1348 (i.e., air exit) intothe second air opening 1914 (i.e., air entrance) of the test slotcooling system housing 1900. The air travels over the air cooler 1920(e.g., over the air cooler fins 1924) which is disposed in or adjacentto the air flow path 1950 and then back into the air entrance 1932 ofthe air mover 1930.

In the examples shown, the storage device transporter 1800 providesclosure of the device opening 1346 of the test slot housing 1340 oncereceived therein. The air director 1830 of the storage devicetransporter 1800 and the air mover 1930 are situated near the inlet ofthe device opening 1346 of the test slot housing 1340. As the air mover1930 moves the air to circulate along the air path 1950, the air movesfrom the first portion 1342 of the test slot housing 1340 along a commondirection to the second portion 1344 of the test slot housing 1340 whiletraversing the entire length of the received storage device 500. Sincethe air moves substantially concurrently along at least the top andbottom surfaces 512, 514 of the storage device 500, the air providessubstantially even cooling of the storage device 500. If the air wasrouted along once side of the storage device first, such as the topsurface 512, and then directed along another side sequentially second,such as the bottom surface 514, the air would become preheated afterpassing over the first side of the storage device 500 before passingover any additional sides of the storage device, thereby providingrelatively less efficient cooling than flowing air over two or moresides of the storage device 500 substantially concurrently and/orwithout recirculation over the storage device 500 before passing throughthe air cooler 1920.

A method of performing storage device testing includes presenting one ormore storage devices 500 to a storage device testing system 100 fortesting at a source location (e.g., a loading/unloading station 600,storage device tote 700, test slot(s) 310, etc.) and actuating anautomated transporter 200 (e.g. robotic arm) to retrieve one or morestorage devices 500 from the source location and deliver the retrievedstorage device(s) 500 to corresponding test slots 1330 disposed on arack 300 of the storage device testing system 100. The method includesactuating the automated transporter 200 to insert each retrieved storagedevice 500 in its respective test slot 1330, and performing a test(e.g., functionality, power, connectivity, etc.) on the storage devices500 received by the test slot 1330. The method may also includeactuating the automated transporter 200 to retrieve the tested storagedevice(s) 500 from the test slot(s) 310 and deliver the tested storagedevice(s) 500 to a destination location (e.g., another test slot 310, astorage device tote 700, a loading/unloading station 600, etc).

A method of regulating the temperature of a storage device 500 receivedin a storage device testing system 100 includes delivering a flow of airinto an air entrance 1346 of a test slot housing 1340 and directing theair flow substantially simultaneously over at least the top and bottomsurfaces 512, 514 of the storage device 500. The method may includedelivering the air flow to an air director 1830 that directs the airflow over at least the top and bottom surfaces 512, 514 of the storagedevice 500. In some implementations, the method includes supporting thestorage device 500 in a storage device transporter 1800 received in thetest slot housing 1340. The storage device transporter 1800 includes abody 1810 having first and second portions 1802, 1804. The first storagedevice transporter body portion 1802 includes the air director 1830 andthe second storage device transporter body portion 1804 is configured toreceive the storage device 500. The storage device 500 has top, bottom,front, rear, right, and left side surfaces 512, 514, 516, 518, 520, 522and is received with its rear surface 518 substantially facing the firstbody portion 1802 of the storage device transporter body 1810. Themethod may include weighting the air director 1830, in some examples theplenum 1836) to reduce movement of the storage device transporter whilereceived by the storage device testing system.

In some implementations, the method includes delivering the air flowinto an air entrance 1832 of the air director 1830. The air director1830 directs the air received through the air entrance 1832 out firstand second air exits 1834, 1835 of the air director 1830. The first airexit 1834 directs air over at least the bottom surface 514 of thereceived storage device 500 and the second air exit 1835 directs airover at least the top surface 512 of the received storage device 500.The air director 1830 may define a cavity 1831 in pneumaticcommunication with the air entrance 1832 and air exits 1834, 1835 of theair director 1830. The air director 1830 includes a plenum 1836 disposedin the cavity 1831 for directing at least a portion of the air receivedin the cavity 1831 out of the first air exit 1834. In some examples, themethod includes weighting the plenum 1836 to reduce movement of thestorage device transporter 1800 while received by the storage devicetesting system 100 (e.g., while received in the test slot 1330).

In some implementations, the method includes directing the flow of airto an air mover 1930 in pneumatic communication with the air entrance1325 of the test slot housing 1340. The air mover 1930 delivers the flowof air into the air entrance 1326 of a test slot housing 320 with theair flow moving along a closed loop path 950 (FIG. 15). The method may1340 receiving the flow of air into the air mover 1930 along a firstdirection 1934 and delivering the air flow to the air entrance 1326 ofthe test slot housing 1340 along a second direction 1938 substantiallyperpendicular to the first direction 1934. The method includes directingthe flow of air over an air cooler 1920 disposed in the air flow path1950 upstream of the air mover 1930. In some examples, the methodincludes delivering the air flow into the air entrance 1326 of the testslot housing 1340 (e.g., via the air mover 1930) at an air flow rate ofup to about 0.122 m³/min (4.308 CFM) and an air pressure of up to about20.88 mmH₂O (0.822 inchH₂O).

Accordingly, other implementations are within the scope of the followingclaims.

What is claimed is:
 1. A storage device transporter comprising: A) atransporter body comprising: i) a first body portion configured to beengaged by automated machinery for manipulation of the storage devicetransporter; and ii) a second body portion configured to receive andsupport a storage device, wherein the first body portion is configuredto receive and direct an air flow over one or more surfaces of a storagedevice supported in the second body portion.
 2. The storage devicetransporter of claim 1, wherein the first body portion includes an airdirector having one or more air entrances for receiving air into thefirst body portion and directing air into the second body portion. 3.The storage device transporter of claim 2, wherein the one or more airentrances are configured to be engaged by automated machinery formanipulation of the storage device transporter.
 4. The storage devicetransporter of claim 1, wherein the second body portion comprises firstand second sidewalls arranged to receive a storage device therebetween.5. The storage device transporter of claim 1, wherein the first bodyportion comprises one or more vision fiducials.
 6. The storage devicetransporter of claim 1, further comprising a clamping mechanism operableto clamp a storage device within the second body portion.
 7. The storagedevice transporter of claim 1, wherein the first body portion isconfigured to direct air over top and bottom surfaces of a storagedevice supported in the second body portion.
 8. The storage devicetransporter of claim 1, wherein the first body portion includes an airdirector having one or more air entrances for receiving air into thefirst body portion and directing air into the second body portion, andwherein the one or more air entrances are arranged to register thestorage device transporter in X, Y, and rotational directions when thestorage device transporter is engaged by automated machinery.
 9. Thestorage device transporter of claim 1, wherein the second body portiondefines a substantially U-shaped opening which allows air to flow over abottom surface of a storage device supported in the storage devicetransporter.
 10. A test slot assembly comprising: A) a storage devicetransporter comprising i) a transporter body comprising: a) a first bodyportion configured to be engaged by automated machinery for manipulationof the storage device transporter; and b) a second body portionconfigured to receive and support a storage device, wherein the firstbody portion is configured to receive and direct an air flow over one ormore surfaces of a storage device supported in the second body portion.B) a test slot comprising: i) a housing defining: a) a test compartmentfor receiving and supporting the storage device transporter, and b) anopen end providing access to the test compartment for insertion andremoval of the disk drive transporter.
 11. The test slot assembly ofclaim 10, wherein the storage device transporter is completely removablefrom the test compartment.
 12. The test slot assembly of claim 10,wherein the storage device transporter is connected to the test slot insuch a manner as to form a drawer for receiving a storage device.
 13. Astorage device testing system comprising: A) automated machinery; and B)A storage device transporter comprising: i) a transporter bodycomprising: a) a first body portion configured to be engaged by theautomated machinery for manipulation of the storage device transporter;and b) a second body portion configured to receive and support a storagedevice, wherein the first body portion is configured to receive anddirect an air flow over one or more surfaces of a storage devicesupported in the second body portion.
 14. The storage device testingsystem of claim 13, wherein the first body portion includes an airdirector having one or more air entrances for receiving air into thefirst body portion and directing air into the second body portion, andwherein the one or more air entrances are configured to be engaged bythe automated machinery for manipulation of the storage devicetransporter.
 15. The storage device testing system of claim 14, whereinthe automated machinery includes a mechanical actuator adapted to engagethe one or more air entrances.
 16. The storage device testing system ofclaim 13, wherein the first body portion comprises one or more visionfiducials, and wherein the automated machinery includes an opticalsystem for detecting the vision fiducials.
 17. The storage devicetesting system of claim 13, wherein the automated machinery includesposts, and wherein the first body portion includes one or more airentrances for receiving air into the first body portion and directingair into the second body portion, the air entrances being arranged to beengaged by the posts to register the storage device transporter in X, Y,and rotational directions when the storage device transporter is engagedby the automated machinery.
 18. The storage device testing system ofclaim 13, wherein the first body portion includes a pair of slots, andwherein the automated machinery includes a pair of claws operable toengage the slots.
 19. The storage device testing system of claim 13,further comprising a clamping mechanism operable to clamp a storagedevice within the second body portion, wherein the automated machineryis operable to actuate the clamping mechanism.
 20. The storage devicetesting system of claim 13, wherein the automated machinery comprises arobotic arm and a manipulator attached to the robotic arm, themanipulator being configured to engage the storage device transporter.